Glancing angle XRD analysis of particle stability under self-ion irradiation in oxide dispersion strengthened alloys
기관명 | NDSL |
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저널명 | Scripta materialia |
ISSN | 1359-6462, |
ISBN |
저자(한글) | London, A.J.,Panigrahi, B.K.,Tang, C.C.,Murray, C.,Grovenor, C.R.M. |
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저자(영문) | |
소속기관 | |
소속기관(영문) | |
출판인 | |
간행물 번호 | |
발행연도 | 2016-01-01 |
초록 | We have used glancing-incident angle X-ray diffraction (GIXRD) to study the stability of oxide nanoclusters in an Fe-14Cr-0.2Ti-0.3Y 2 O 3 ODS alloy. High dose self-ion irradiation produces damaged layers a few hundred nanometres deep normally requiring time-consuming, site-specific techniques to study them. We have shown that GIXRD provides an effective way to study the damage depth profile by varying the incident angle, and that the Y 2 Ti 2 O 7 nanoclusters in these alloys are disrupted by high dose irradiation at temperatures from 150 to 973K. |
원문URL | http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=NART&cn=NART73169804 |
첨부파일 |
과학기술표준분류 | |
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ICT 기술분류 | |
DDC 분류 | |
주제어 (키워드) | Oxide dispersion strengthened steel,ODS,Glancing incidence X-ray diffraction,Ion irradiation |