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논문 기본정보
Monitoring the recrystallisation of amorphous xylitol using Raman spectroscopy and wide-angle X-ray scattering
논문 개요
| 기관명 | NDSL |
|---|---|
| 저널명 | International journal of pharmaceutics |
| ISSN | 0378-5173, |
| ISBN |
논문저자 및 소속기관 정보
| 저자(한글) | Palomaki, E.,Ahvenainen, P.,Ehlers, H.,Svedstrom, K.,Huotari, S.,Yliruusi, J. |
|---|---|
| 저자(영문) | |
| 소속기관 | |
| 소속기관(영문) | |
| 출판인 | |
| 간행물 번호 | |
| 발행연도 | 2016-01-01 |
| 초록 | In this paper we present a fast model system for monitoring the recrystallization of quench-cooled amorphous xylitol using Raman spectroscopy and wide-angle X-ray scattering. The use of these two methods enables comparison between surface and bulk crystallization. Non-ordered mesoporous silica micro-particles were added to the system in order to alter the rate of crystallization of the amorphous xylitol. Raman measurements showed that adding silica to the system increased the rate of surface crystallization, while X-ray measurements showed that the rate of bulk crystallization decreased. Using this model system it is possible to measure fast changes, which occur in minutes or within a few hours. Raman-spectroscopy and wide-angle X-ray scattering were found to be complementary techniques when assessing surface and bulk crystallization of amorphous xylitol. |
| 원문URL | http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=NART&cn=NART75724700 |
| 첨부파일 |
추가정보
| 과학기술표준분류 | |
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| ICT 기술분류 | |
| DDC 분류 | |
| 주제어 (키워드) | Amorphous,Crystallization,Raman spectrometry,Wide-angle X-ray scattering,Xylitol,Non-ordered mesoporous silica |