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특허/실용신안

EVALUATION AID

특허 실용신안 개요

기관명, 출원인, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 권리구분, 초록, 원본url, 첨부파일 순으로 구성된 표입니다.
기관명 NDSL
출원인 NATIONAL UNIVERSITY CORPORATION, TOHOKU UNIVERSITY
출원번호 US-0092376
출원일자 2016-04-06
공개번호 20160825
공개일자 0000-00-00
등록번호
등록일자 0000-00-00
권리구분 USAP
초록 An evaluation aid serves as a phantom (imitation lesion) when a digital X-ray image is taken, and evaluation is then carried out through the digital X-ray image. The evaluation aid can simplify evaluating image qualities of a digital X-ray image for X-ray absorption parts having different X-ray absorption ratios all at once. The evaluation aid contains a substrate (plate-like body) including a plurality of regions having different X-ray absorption ratios for taking a digital X-ray image to carry out evaluation. Step members are provided on the plate-like body so as to correspond to the plurality of regions, respectively, where each step member includes a plurality of subregions having different X-ray absorption ratios. Preferably the thicknesses and/or constituent materials of the plurality of regions of the substrate are different from each other in order to have different X-ray absorption ratios in these regions.
원문URL http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=USAP&cn=USA2016080242729
첨부파일

추가정보

과학기술표준분류, ICT 기술분류, IPC분류체계CODE, 주제어 (키워드) 순으로 구성된 표입니다.
과학기술표준분류
ICT 기술분류
IPC분류체계CODE
주제어 (키워드)