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특허/실용신안

METHOD AND SYSTEM FOR IMPROVED CLASSIFICATION OF CONSTITUENT MATERIALS

특허 실용신안 개요

기관명, 출원인, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 권리구분, 초록, 원본url, 첨부파일 순으로 구성된 표입니다.
기관명 NDSL
출원인 GEN ELECTRIC
출원번호 US-0063392
출원일자 2015-12-02
공개번호 20160805
공개일자 0000-00-00
등록번호
등록일자 0000-00-00
권리구분 WOPA
초록 An imaging system and method are disclosed. An MR image and measured B0 field map of a target volume in a subject are reconstructed, where the MR image includes one or more bright and/or dark regions. One or more distinctive constituent materials corresponding to the bright regions are identified. Each dark region is iteratively labeled as one or more ambiguous constituent materials. Susceptibility values corresponding to each distinctive and iteratively labeled ambiguous constituent material is assigned. A simulated B0 field map is iteratively generated based on the assigned susceptibility values. A similarity metric is determined between the measured and simulated B0 field maps. Constituent materials are identified in the dark regions based on the similarity metric to ascertain corresponding susceptibility values. The MRI data is corrected based on the assigned and ascertained susceptibility values. A diagnostic assessment of the target volume is determined based on the corrected MRI data.
원문URL http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=WOPA&cn=WPA2016A10089976
첨부파일

추가정보

과학기술표준분류, ICT 기술분류, IPC분류체계CODE, 주제어 (키워드) 순으로 구성된 표입니다.
과학기술표준분류
ICT 기술분류
IPC분류체계CODE A61B-005/055(2006.01),G01R-033/20(2006.01)
주제어 (키워드)