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특허/실용신안

X-ray CT microscopy system and method utilizing lattice sampling

특허 실용신안 개요

기관명, 출원인, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 권리구분, 초록, 원본url, 첨부파일 순으로 구성된 표입니다.
기관명 NDSL
출원인 Thompson, William
출원번호 US-0054194
출원일자 2016-02-26
공개번호 20160901
공개일자 0000-00-00
등록번호
등록일자 0000-00-00
권리구분 USAP
초록 X-ray microscopy tomography scanning systems are not constrained by continuous scanning trajectories like in medical scanners. In fact, the source and detector can be held stationary during subsequent image capture producing a discrete sampling pattern. For such systems, a method of producing an optimized, even illumination of the object by choosing source/detector locations on a surface of an imaginary cylinder surrounding the object is disclosed. The locations, in one example, form a regular lattice with even coverage on the surface of that cylinder, rather than at locations along a continuous curve such as a helix. Using this method, the effective pitch may be increased beyond the theoretical limit imposed by helical scanning, allowing a greater range of y-axis coverage for the same number of projection angles, corresponding to an increase in throughput.
원문URL http://click.ndsl.kr/servlet/OpenAPIDetailView?keyValue=03553784&target=USAP&cn=USA2016090252467
첨부파일

추가정보

과학기술표준분류, ICT 기술분류, IPC분류체계CODE, 주제어 (키워드) 순으로 구성된 표입니다.
과학기술표준분류
ICT 기술분류
IPC분류체계CODE
주제어 (키워드)